Advantest lines up test solutions for SEMICON India

SEMICON India 2024 will be co-located with electronica India and productronica India, uniting different sectors of the electronics ecosystem to create India’s largest forum for exhibiting the latest advancements in electronic products and technologies.

The event will enable Advantest to show its support for India’s emerging semiconductor industry. India’s market for semiconductors and electronics has developed rapidly in recent years, and many prominent companies, including Advantest, are expanding their presence in the region.

Advantest Director and Chairperson of the Board Yoshiaki Yoshida will be presenting an overview of the company at SEMICON India during the keynote, “Creating a Vibrant Semiconductor Ecosystem in India,” at the IEML Banquet Hall on Sept. 11 starting at 2:30 pm.

This year marks a significant milestone for Advantest as the company celebrates its 70th anniversary under the theme of "Facing the Future Together."

Advantest will host a digital display at its booth featuring key test solutions that enable innovation and leading-edge technologies essential to our daily lives.

-        SoC Test Systems:

• V93000 EXA Scale SoC test system, offering a flexible, scalable and cost-efficient test platform that addresses the latest industry challenges and enables sophisticated applications such as AI and HPC.
• T2000 SoC test systems with Rapid Development Kit (RDK) for all SoCs, including automotive and power analog, and IP Engine 4 test solutions for fastest image processing to reduce CIS testing time and costs.

-        Memory Test Systems:

• Next-generation Flash/NVM test solutions, such as T5851-STM32G, capable of testing and covering the latest generation of embedded protocol NAND devices with UFS/PCIe interface up to 32 Gbps and T5230with a combined array architecture to reduce test cost for NAND/NVM wafer test, including DRAM wafer-level burn-in (WLBI).

-        CREA’s power semiconductor test equipment for a wide variety of power devices, including SiC and GaN power testing on wafer, single-die, substrate, PKG, and module, typically used in industrial and automotive applications.